Low energy system for sensor data collection and measurement data sample collection method

ABSTRACT

A data collection system includes one or more input sensing devices and a data collection device. The data collection device includes data collection circuitry that is continuously activated to capture measurement data samples from the one or more input sensing devices and locally store the measurement data samples. The data collection device also includes a digital processor that is coupled to the data collection circuitry and is activated to locally perform a sample analysis of the measurement data samples, wherein the sample analysis is a regular analysis of routine measurement data samples when the measurement data samples are without a triggering event, and wherein the sample analysis is an event analysis when the measurement data samples include a triggering event. A data collection integrated circuit and a measurement data sample collection method are also included.

TECHNICAL FIELD

This application is directed, in general, to data gathering systems and,more specifically to a data collection integrated circuit, a datacollection system and a measurement data sample collection method.

BACKGROUND

This section introduces aspects that may help facilitate a betterunderstanding of the disclosure. Accordingly, the statements of thissection are to be read in this light and are not to be understood asadmissions about what is prior art or what is not prior art.Applications employing input measurement devices can typically bedesigned to constantly collect data associated with their environment.These collection systems usually need to be “always-on” systems and mayinvolve one or more sensors. For example, a microphone may be used toacquire data from its environment that is to be analyzed for itscontent. This collection and analysis activity is usually added to thetasks of a host general purpose processor in a system, wherein the hostgeneral purpose processor may also be used for controlling overallsystem operations including scheduling the timing of data collection andfollow-on signal data processing. In such applications, other generalsystem elements such as shared processing operations, shared systemmemory and various bus interactions along with multiple possibleinterface conditions come into play that may cause critical datacollections to be corrupted or even missed. Additionally, the use ofgeneral system elements for always-on data collection and processingconditions tends to be expensive from an energy usage standpoint.

SUMMARY

One embodiment is a data collection integrated circuit. The datacollection integrated circuit includes data collection circuitryconfigured to be continuously activated to capture measurement datasamples from one or more input sensing devices and locally store themeasurement data samples for sample analysis. The data collectionintegrated circuit also includes a digital processor coupled to the datacollection circuitry and configured to be separately activated from thedata collection circuitry to locally perform a regular sample analysisof routine measurement data samples and an event sample analysis whenthe measurement data samples have a triggering event.

Another embodiment is a data collection system. The data collectionsystem includes one or more input sensing devices and a data collectiondevice. The data collection device includes data collection circuitrythat is continuously activated to capture measurement data samples fromthe one or more input sensing devices and locally store the measurementdata samples. The data collection device also includes a digitalprocessor that is coupled to the data collection circuitry and isactivated to locally perform a sample analysis of the measurement datasamples, wherein the sample analysis is a regular analysis of routinemeasurement data samples when the measurement data samples are without atriggering event, and wherein the sample analysis is an event analysiswhen the measurement data samples include a triggering event.

Yet another embodiment is a measurement data sample collection method.The measurement data sample collection method includes defining asampling configuration for collecting measurement data samples,capturing the measurement data samples continuously with the samplingconfiguration and analyzing the measurement data samples, wherein alocal sample analysis provides a regular analysis for measurement datasamples that are routine and an event analysis when the measurement datasamples have a triggering event.

The foregoing has outlined preferred and alternative features of thepresent disclosure so that those skilled in the art may betterunderstand the detailed description of the disclosure that follows.Additional features of the disclosure will be described hereinafter thatform the subject of the claims of the disclosure. Those skilled in theart will appreciate that they can readily use the disclosed conceptionand specific embodiment as a basis for designing or modifying otherstructures for carrying out the same purposes of the present disclosure.

BRIEF DESCRIPTION

The embodiments of the disclosure are best understood from the followingdetailed description, when read with the accompanying Figures. Referenceis now made to the following descriptions taken in conjunction with theaccompanying drawings, in which:

FIG. 1 illustrates an embodiment of a data collection system,constructed according to the principles of the present disclosure;

FIG. 2 illustrates a pairing example of input sensing and datameasurement devices, as may be employed in the data collection system ofFIG. 1; and

FIG. 3 illustrates a flow diagram of an embodiment of a method ofmeasurement data sample collection, carried out according to theprinciples of the present disclosure.

DETAILED DESCRIPTION

The description and drawings merely illustrate the principles of thedisclosure. It will thus be appreciated that those skilled in the artwill be able to devise various arrangements that, although notexplicitly described or shown herein, embody the principles of thedisclosure and are included within its scope. Furthermore, all examplesrecited herein are principally intended expressly to be for pedagogicalpurposes to aid the reader in understanding the principles of thedisclosure and concepts contributed by the inventors to furthering theart, and are to be construed as being without limitation to suchspecifically recited examples and conditions. Moreover, all statementsherein reciting principles, aspects, and embodiments of the disclosure,as well as specific examples thereof, are intended to encompassequivalents thereof. Additionally, the term, “or,” as used herein,refers to a non-exclusive or, unless otherwise indicated. Also, thevarious embodiments described herein are not necessarily mutuallyexclusive, as some embodiments can be combined with one or more otherembodiments to form new embodiments.

Embodiments of the present disclosure provide continuous monitoring andcapture of measurement data samples employing a dedicated datacollection integrated circuit (IC) or device that is designed to extendan overall operating time through electrical energy conservation. (Asused herein, the terms “continuous” and “continuously” are defined asoccurring without interruption or without cessation in time)

The dedicated data collection IC or device generally provides a localand independent selection and analysis of the measurement data samples.(Herein, the terms “local” and “locally” are defined as solely employingthe dedicated data collection IC or device.) The dedicated datacollection IC or device may receive a request for obtaining andanalyzing certain types of measurement data samples from an externalentity (e.g., an associated System on Chip (SOC)). Alternately, thededicated data collection IC or device may report the results fromobtaining and analyzing measurement data samples to the external entity.

For purposes of this disclosure, a sample analysis is either a regularanalysis or an event analysis depending on whether the measurement datasamples are routine measurement data samples or whether they contain atriggering event, respectively. Therefore, the regular analysis ofroutine data samples provides analysis results that are withinestablished boundaries and have routine results that are basicallyanticipated or expected. In some embodiments, the regular analysistypically provides routine results of an “update” nature. Alternately,the event analysis of measurement data samples containing a triggeringevent recognizes that something unexpected and not routine has occurredin the measurement data samples being addressed. In some embodiments,the event analysis typically results in an alarm condition correspondingto and based on the nature of the triggering event.

For purposes of this disclosure, a triggering event of the measurementdata samples is defined as a pattern of interest or a specific conditionthat has occurred in one or a collection of the measurement datasamples. An occurrence of this pattern of interest requires a processingaction that is outside of or beyond a normal or regular scope ofanalysis. For example, this triggering event occurrence can indicatethat a measurement data sample limit has been exceeded and certainalarms are required to indicate this occurrence. Alternately, thepattern of interest can indicate that the one or more measurement datasamples involve certain people or information that requires furtheranalysis or reporting. Generally, a triggering event is defined as anevent that is known and observed, or alternately, the triggering eventcan be something unexpected and recognized.

FIG. 1 illustrates an embodiment of a data collection system, generallydesignated 100, constructed according to the principles of the presentdisclosure. The data collection system 100 includes input sensingdevices 105 coupled to a data collection device 110. The data collectiondevice 110 includes data collection circuitry 115 having a datameasurement unit 120, a local memory bus 125 employing direct memoryaccess (DMA) 130 to the data measurement unit 120 and a data tightlycoupled memory 140 coupled to the local memory bus 125.

The data measurement unit 120 includes an Inter-IC Sound (I²S or I2S, asshown) module 121, a dual input multiplexing analog-to-digital converter(ADC) 122 and first and second pulse-density modulation units (PDMs)123, 124, as shown.

The data collection device 110 also includes a digital processor 150that is coupled to the local memory bus 125. The data collection device110 further includes a peripheral memory (PMEM) 160 coupled to the localmemory bus 125 and an instruction tightly coupled memory (ITCM) 165, adata cache (D$) 170 and an instruction cache (1$) 175 coupled to thedigital processor 150. The data collection system 100 additionallyemploys an Advanced High-performance Bus (AHB) 180 to interface with abus memory 185 that is part of another processing system (e.g., a Systemon Chip associated with the data collection system 100).

In the data collection system 100, which can typically employ multipleinput sensing devices and peripherals that function as output devices,an entire data acquisition path is provided that is completelyinternalized within the data collection device 110. That is, the entiredata acquisition path from measurement data sample capture, dataprocessing, transfer of processed data samples and resulting processedanalysis or information to output peripheral devices is accomplishedlocally within the data collection device 110. This avoids having toemploy data analysis or processing capabilities that are remote to thedata collection device 110.

In the data collection system 100, the one or more input sensing devices105 and the data collection device 110 are often embodied in anintegrated circuit format. The input sensing devices 105 are sensingdevices that provide desired characteristics for capture and analysisthat are typically associated with their environment. Examples of theinput sensing devices 105 will be further defined and discussed withrespect to FIG. 2. The data collection device 110 employs the datameasurement unit 120 to continuously capture measurement data samplesfrom the one or more input sensing devices 105 and transfer them withoutdata loss or interruption from the data measurement unit 120 to the datatightly coupled memory 140 for storage.

The Inter-IC Sound (I²S) module 121 employs an electrical serial businterface standard used for connecting digital audio devices together.In one application, it may be used to communicate pulse code modulated(PCM) audio data between integrated circuits in an electronic device.The I²S bus separates clock and serial data signals, resulting in alower jitter than is typical of communications systems that recover theclock from the data stream.

The dual input multiplexing analog-to-digital converter (ADC) 122accepts inputs from two separate input sensing devices, in thisembodiment. These two input sensing devices provide analog signals tothe ADC 122 that are multiplexed in time to be employed by the singleADC 122. The ADC 122 converts each of these two inputs into acorresponding and separate digital representation (i.e., a binaryquantity) for storage in one or more of the memory banks 142-148.

Each of the first and second pulse-density modulation units (PDMs) 123,124 accepts a separate analog input from the input sensing devices 105for conversion into a digital representation. Pulse-density modulationis a form of modulation used to represent an analog signal with a binaryquantity. Here, specific input signal amplitudes are represented by acorresponding number of pulses generated in a specific time frame (i.e.,a pulse density), which is then converted into a binary quantity forstorage in the data tightly coupled memory 140.

The data tightly coupled memory 140 is a local memory that is organizedinto four independent memory banks BANKO, BANK1, BANK2 and BANK3. Theseare also designated as memory banks 142, 144, 146 and 148, respectively,that are independently accessible by devices on the local memory bus125. This memory organization allows for parallel access from multipledata measurement devices of the data measurement unit 120 through theDMA 130 of the local memory bus 125 to separate memory destinations aslong as different ones of the memory banks 142-148 are employed. Thememory banks 142-148 are also accessible to the digital processor 150through the local memory bus 125 where the digital processor 150 cananalyze captured measurement data samples stored in the memory banks142-148. Additionally, the local memory bus 125 can be used to interfaceany local hardware accelerators to the memory banks 142-148, as well.

Generally, the digital processor 150 initially configures the datacollection circuitry 115, which provides a sampling environment, todefine a sampling configuration for collecting measurement data samples.Additionally, configuration of output peripherals can also beaccomplished with the digital processor 150 through the PMEM 160interface.

The digital processor 150 provides a sample analysis of the measurementdata samples wherein this sample analysis may basically capture anoccurrence of or determine required features and correspondingrelationships of the measurement data samples. The digital processor 150employs the instruction tightly coupled memory (ITCM) 165, the datacache (D$) 170 and the instruction cache (1$) 175 to facilitate thesample analysis process. As noted earlier, the sample analysis iscorrespondingly a regular analysis when routine measurement data samplesare encountered (i.e., those samples without a triggering event).Alternately, the sample analysis is an event analysis when themeasurement data samples include a triggering event. The digitalprocessor 150 provides the sample analysis for collected measurementdata samples, which may be provided concurrently with continuedcollection of new measurement data samples, without losing datacollection cadence.

The digital processor 150 may provide one or more sample analysisemploying only measurement data samples corresponding to a same inputsensing device (e.g., only temperature). Alternately, the sampleanalysis of the measurement data samples may include analyzingmeasurement data samples from different input sensing devices.Additionally, the sample analysis of the measurement data samplesincludes analyzing a selectable number of measurement data samples.Further, the sample analysis of the measurement data samples includesanalyzing the measurement data samples on a periodic basis. Stillfurther, an event analysis of the measurement data samples may beperformed during an activation of a regular analysis upon discovery of atriggering event.

Results of these sample analyses may indicate updated informationconcerning trends associated with at least a portion of the measurementdata samples. For example, this may apply to temperature or humiditymonitoring. Such information may be reported over the AHB 180 to the busmemory 185 for use by another system, for example.

The digital processor 150 may also manage the resources in the datacollection system 100 to ensure their optimal usage. This optimal usagemay include taking the least amount of time for any given task orconsuming a least amount of memory for a complete application, forexample. Together, these and other operational considerations cancontribute to a desired objective of reducing overall energyconsumption, thereby enabling a longer and more reliable operation overan extended period of time, especially when operation is based on asupporting battery.

The PMEM 160 is a local memory subsystem containing a peripheral memoryregion that can be used for low latency access to memory mappedregisters. It can be used to interface with multiple independentperipherals associated with the data collection device 110 using thememory mapped registers. The PMEM 160 can also be used to containperipherals that can be used as an output device (i.e., a speaker for avoice subsystem).

The AHB 180 employs a bus protocol specified by Advanced MicrocontrollerBus Architecture and accommodates large bus-widths (64/128 bits). Asimple transaction on the AHB 180 consists of an address phase and asubsequent data phase without wait states and employing only twobus-cycles. Access to a target device is controlled through amultiplexer (non-tristate), thereby admitting bus access to onebus-master at a time.

Elements of the data collection system 100 that require a condition ofbeing continuously powered-up (i.e., always-on) are any of the devicesin the data measurement unit 115 that are collecting measurement datasamples, the local memory bus 125 including the DMA 130, any of thememory banks 142-148 that are being actively employed by the datameasurement unit 115 and possibly the PMEM 160. Alternately, the digitalprocessor 150, the ITCM 165, The D$ 170, the I$ 175 and the AHB 180 cantypically reside in a reduced-power state until activated. This resultsin an overall reduced energy consumption.

FIG. 2 illustrates a pairing example of input sensing and datameasurement devices, generally designated 200, as may be employed in thedata collection system 100 of FIG. 1. The input sensing devices 105include an Inter-IC Sound (I²S) module 221, a temperature sensor 222 a,a humidity sensor 222 b, a first microphone 223 and a second microphone224. These input sensing devices are respectively coupled to the I²Smodule 121, the dual input multiplexing analog-to-digital converter(ADC) 122 and the pulse-density modulation units (PDMs) 123, 124, asshown.

Generally, the two I²S modules 221 and 121 are configured to transmitdigital data between the two. Depending of their application, either oneof the two I²S modules 221 and 121 may function as a transmitter toconvey data to the other acting as a receiver of the data.

The temperature sensor 222 a and the humidity sensor 222 b are examplesof analog devices that present continuous measurement signals to the ADC122, which multiplexes between the two signals to provide digitalrepresentations of the two sensors. This arrangement essentiallyconverts the temperature and humidity sensors 222 a, 222 b into digitalsensors.

Similarly, the first and second microphones 223, 224 present continuousmeasurement signals respectively to the first and second PDMs 123, 124of the data measurement unit 120. Correspondingly, this arrangementconverts the first and second microphones 223, 224 into digital sensors.

FIG. 3 illustrates a flow diagram of an embodiment of a measurement datasample collection method, generally designated 300, carried outaccording to the principles of the present disclosure. The method 300starts in a step 305, and then, a sampling configuration is defined forcollecting measurement data samples, in a step 310. The measurement datasamples are captured continuously with the sampling configuration, in astep 315. The measurement data samples are analyzed, wherein a localsample analysis provides a regular analysis for measurement data samplesthat are routine and an event analysis when the measurement data sampleshave a triggering event, in a step 320.

In one embodiment, defining the sampling configuration includesselecting input sensing devices coupled to data measuring devices thatemploy independent memory banks accessible through a local memory bushaving direct memory access for storage of the measurement data samples.

In another embodiment, defining the sampling configuration and analyzingthe measurement data samples include activating a digital processorhaving a peripheral memory, an instruction tightly coupled memory, aninstruction cache and a data cache.

In yet another embodiment, analyzing the measurement data samplesincludes analyzing a selectable quantity of measurement data samples. Instill another embodiment, analyzing the measurement data samplesincludes analyzing measurement data samples from multiple input sensingdevices. In a further embodiment, an energy-conserving operatingenvironment is maintained when defining, capturing and analyzing themeasurement data samples. The method 300 ends in a step 325.

While the method disclosed herein has been described and shown withreference to particular steps performed in a particular order, it willbe understood that these steps may be combined, subdivided, or reorderedto form an equivalent method without departing from the teachings of thepresent disclosure. Accordingly, unless specifically indicated herein,the order or the grouping of the steps is not a limitation of thepresent disclosure.

The above-described system, method and apparatus or at least a portionthereof may be embodied in or performed by various processors, such asmicroprocessors, digital data processors, digital signal processors, orother computing devices, wherein the various processors are programmedor store executable programs or sequences of software instructions toperform one or more of actions required or method steps. The softwareinstructions of such programs may represent algorithms and be encoded inmachine-executable form on non-transitory digital data storage media,e.g., magnetic or optical disks, random-access memory (RAM), magnetichard disks, flash memories, and/or read-only memory (ROM), to enablevarious types of digital data processors or computers to perform one,multiple or all of the steps of one or more of the above-describedmethods or functions of the system described herein.

Certain embodiments disclosed herein may further relate to computerstorage products with a non-transitory computer-readable medium thathave program code thereon for performing various computer-implementedoperations that embody at least part of the apparatuses, the system orcarry out or direct at least some of the steps of the method set forthherein. Non-transitory medium used herein refers to allcomputer-readable media except for transitory, propagating signals.

Those skilled in the art to which this application relates willappreciate that other and further additions, deletions, substitutionsand modifications may be made to the described embodiments.

1. A data collection integrated circuit, comprising: data collectioncircuitry in the data collection integrated circuit configured to becontinuously activated to capture measurement data samples from one ormore input sensing devices and locally store the measurement datasamples for sample analysis; and a digital processor in the datacollection integrated circuit coupled to the data collection circuitryand configured to be separately activated from the data collectioncircuitry to analyze locally the measurement data samples to: locallyperform a regular sample analysis of measurement data samples asdetermined by the digital processor, or locally perform an event sampleanalysis when the measurement data samples have a triggering event asdetermined by the digital processor.
 2. The integrated circuit of claim1 wherein the data collection circuitry includes a data measurement unitand a local data tightly coupled memory organized into operationallyindependent memory banks to store the measurement data samples through alocal memory bus having direct memory access.
 3. The integrated circuitof claim 2 wherein the data measurement unit includes an analog todigital converter, a pulse-density modulation unit or anI-squared-circuit or system.
 4. The integrated circuit of claim 1wherein the digital processor determines a sampling configuration of thedata collection circuitry for capturing the measurement data samples. 5.The integrated circuit of claim 1 wherein activation of the digitalprocessor includes the digital processor being awakened from a reducedpower state for the sample analysis of the measurement data samples. 6.The integrated circuit of claim 1 wherein activation of the digitalprocessor includes the digital processor being activated when a presetnumber of measurement data samples has been captured.
 7. The integratedcircuit of claim 1 further comprising a peripheral memory that storesanalysis information for use by a peripheral along with an instructiontightly coupled memory, an instruction cache and a data cache thatenhance processing performance of the digital processor.
 8. Theintegrated circuit of claim 1 wherein non-activated circuit portions aremaintained in a reduced-power operating state to conserve energy.
 9. Theintegrated circuit of claim 1 wherein a sample analysis includesanalyzing measurement data samples from multiple input sensing devices.10. A measurement data sample collection method of a data collectionintegrated circuit, comprising: defining a sampling configuration forcollecting measurement data samples of the data collection integratedcircuit; capturing the measurement data samples continuously with thesampling configuration of the data collection integrated circuit; andanalyzing locally the measurement data samples of the data collectionintegrated circuit, wherein a local sample analysis provides a regularanalysis for measurement data samples that are routine and an eventanalysis when the measurement data samples have a triggering event. 11.The method of claim 10 wherein defining the sampling configurationincludes selecting input sensing devices coupled to data measuringdevices that employ independent memory banks accessible through a localmemory bus having direct memory access for storage of the measurementdata samples.
 12. The method of claim 10 wherein defining the samplingconfiguration and analyzing the measurement data samples includeactivating a digital processor having a peripheral memory, aninstruction tightly coupled memory, an instruction cache and a datacache.
 13. The method of claim 10 wherein analyzing the measurement datasamples includes analyzing a selectable quantity of measurement datasamples.
 14. The method of claim 10 wherein analyzing the measurementdata samples includes analyzing measurement data samples from multipleinput sensing devices.
 15. The method of claim 10 further comprisingmaintaining an energy-conserving operating environment when defining,capturing and analyzing the measurement data samples.
 16. A datacollection system, comprising: one or more input sensing devices; and adata collection device, including: data collection circuitry of the datacollection device that is continuously activated to capture measurementdata samples from the one or more input sensing devices and locallystore the measurement data samples; and a digital processor of the datacollection device that is coupled to the data collection circuitry andis activated to locally perform a sample analysis of the measurementdata samples, wherein the sample analysis is a regular analysis ofroutine measurement data samples when the measurement data samples arewithout a triggering event as determined by the data collection device,or wherein the sample analysis is an event analysis when the measurementdata samples include a triggering event as determined by the datacollection device.
 17. The system of claim 16 wherein the one or moreinput sensing devices include analog signal devices, digital signaldevices, serial data devices or pulse modulation devices.
 18. The systemof claim 16 wherein the data collection circuitry includes a datameasurement unit having an analog to digital converter, a pulse-densitymodulation unit or an I-squared-circuit or system and a local datatightly coupled memory organized into operationally independent memorybanks to store the measurement data samples through a local memory bushaving direct memory access.
 19. The system of claim 16 furthercomprising a peripheral memory that stores analysis information for useby a peripheral along with an instruction tightly coupled memory, aninstruction cache and a data cache that enhance processing performanceof the digital processor.
 20. The system of claim 16 whereinnon-activated system components are maintained in a reduced-poweroperating state to conserve energy.